Density and index of refraction of water ice films vapor deposited at low temperatures
نویسندگان
چکیده
The density of 0.5–3 mm thick vapor-deposited films of water ice were measured by combined optical interferometry and microbalance techniques during deposition on an optically flat gold substrate from a capillary array gas source. The films were of high optical quality with an index of refraction of 1.2960.01 at 435.8 nm, a density of 0.8260.01 g/cm, and a porosity of 0.1360.01. In contrast to previous studies, none of the measured properties exhibited any significant variation with growth rate or temperature over the range studied ~0.6–2 nm/min, 20–140 K!. © 1998 American Institute of Physics. @S0021-9606~98!50408-4#
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